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  • 2025-09-10 [Wednesday]
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  • West Conference Area 2F, W201
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  • East Conference Area 2F, E210
  • East Conference Area 3F, E301
  • East Conference Area 3F, E302
  • East Conference Area 3F, E303
  • East Conference Area 3F, E306
  • East Conference Area 3F, E311

2025-09-10 (Wednesday)

Electron Microscopy and Materials Science
Parallel Session Chair: Rong Yu ,Tsinghua University

East Conference Area 2F, E201 (UTC+8) 2025-09-10 Local Time

09:10-10:20 (UTC+8) 09:10-10:20 Local Time | In - situ Electron Microscopy Training Course


10:20-10:45 (UTC+8) 10:20-10:45 Local Time | Coffee Break
10:45-11:55 (UTC+8) 10:45-11:55 Local Time | 4D-STEM Training Course
12:00-13:20 (UTC+8) 12:00-13:20 Local Time | Lunch Break
13:20-15:00 (UTC+8) 13:20-15:00 Local Time | Session 1
NO. Beijing Time (UTC+8) Local Time Type Presentation Topic Speaker Affiliation / Organization
1-I-2 13:20-13:40 13:20-13:40 Invited

Advancing layered cathode material's cycling stability from uniform doping to non-uniform doping

Manling Sui Beijing University of Technology
1-I-3 13:40-14:00 13:40-14:00 Invited

In-situ Manipulation of the Ferroelectric Domain and Domain Walls

He Tian Zhejiang University
1-O-1 14:00-14:20 14:00-14:20 Oral

In situ integrated solution for straining, heating, biasing, illuminating, magnetizing and cooling for TEM

Jixiang Cai
1-I-11 14:20-14:40 14:20-14:40 Invited

In-situ S/TEM observation of electromechanical strain in antipolar and in ion-conductive semiconductors

Jinsong WU
1-I-4 14:40-15:00 14:40-15:00 Invited

Visualized Atomic Scale Manufacturing

Litao Sun Southeast University, China
15:00-15:10 (UTC+8) 15:00-15:10 Local Time | Coffee Break
15:10-17:30 (UTC+8) 15:10-17:30 Local Time | Session 2
NO. Beijing Time (UTC+8) Local Time Type Presentation Topic Speaker Affiliation / Organization
1-I-5 15:10-15:30 15:10-15:30 Invited

Low-Dose Electron Microscopy Imaging

Yu Han South China University of Technology
1-I-6 15:30-15:50 15:30-15:50 Invited

Atomic scale (S)TEM study on microstructural evolution of nanoscale semiconductor materials

Jianbo Wang Wuhan University
1-I-7 15:50-16:10 15:50-16:10 Invited

Formation of Nanocrystals: In Situ Tracking from Disorder to Order

Rongming Wang University of Science and Technology Beijing
1-O-2 16:10-16:20 16:10-16:20 Oral

Super-resolution electron microscopy based on 4D-STEM ptychography

Yu Kang
1-I-8 16:20-16:40 16:20-16:40 Invited

Three-dimensional imaging of atoms at complex interfaces using atomic resolution electron tomography

Jihan Zhou Peking University
16:40-17:00 16:40-17:00 Invited

Analysis and manipulation of local structures in layered materials

Qiang Zheng
1-I-9 17:00-17:20 17:00-17:20 Invited

Prototype topological spin tropics in situ transmission electron microscope

Yong Peng Lanzhou University